Focusing properties  of a zone plate investigation for a hard x-ray
V.V. Kotlyar, A.G. Nalimov, M.I. Shanina, V.A. Soifer, L.O’Faolain, E.V. Mineev, I.V. Yakimchuk, V.E. Asadchikov

Full text of article: Russian language.

Abstract:
Design and investigate of a Fresnel zone plate of silver on a silicon nitride baffle having diameter 200 μm, end zone width of 460 nm for 2,29 Å and calculated efficiency of 3% is described. It was discovered experimentally by a detector with element resolution 13x13 μm, that central intensity maximum appears and stable propagates from 20 to 60 mm from zone plate in the near-field, which is 6% higher surrounding intensity level.

Key words:
zone plate, X-ray radiation, X-ray focusing

References:

  1. Guttmann, P. Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM / P. Guttmann, C. Bittencourt, S. Rehbein, P. Umek, X. Ke, G. Van Tendeloo, C.P. Ewels, G. Schneider // Nature Photonics. – 2012. –V. 6, N 1. – P. 25-29.
  2. Barty, A. Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements / A. Barty, C. Caleman, A. Aquila, N. Timneanu [et al] // Nature Photonics. – 2012. –V. 6, N 1. – P. 35-40.
  3. Feng, Y. Nanofabrication of high aspect ratio 24 nm x-ray zone plates for x-ray imaging applicatioins / Y. Feng, M. Feser, A. Lyon, S. Rishton [et al] // J. Vac. Sci. Technol. B. – 2007. – V. 25, N 6. – P. 2004-2007.
  4. Vila-Comamala, J. Advanced X-ray diffractive optics / J. Vila-Comamala, K. Jefimov, T. Pilvi, M. Ritala [et al] // J. Physics: Conf. Ser. “9th Int. Conf. on X-Ray Microscopy”. – 2009. – V. 186. – P. 012078.
  5. Tamura, S. Quasi-kinoform type multilayer zone plate with high diffraction efficiency for high-energy x-rays / S. Tamura, M. Yasumoto, N. Kamijo, K. Uesugi [et al] // J. Physics: Conf. Ser. “9th Int. Conf. on X-Ray Microscopy”. – 2009. – V. 186. – P. 012075.
  6. Holmberg, A. Soft x-ray zone plate fabrication at KTH, Stockholm / A. Holmberg, M. Lindblom, J. Reinspach, M. Bertilsson, H.M. Hertz // J. Physics: Conf. Ser. “9th Int. Conf. on X-Ray Microscopy”. – 2009. – V. 186. – P. 012065.
  7. Bertilson, M. First application experiments with the Stockholm compact soft x-ray microscope / M. Bertilson, O. von Hofsten, J. Thieme, M. Lindblom, A. Holmberg [et al] // J. Physics: Conf. Ser. “9th Int. Conf. on X-Ray Microscopy”. – 2009. – V. 186. – P. 012025.
  8. Watanabe, N. X-ray phase micro-tomography using an interference microscope with zone plates / N. Watanabe, M. Hoshino, K. Yamamoto, S. Aoki, A. Takeuchi, Y. Suzuki // J. Physics: Conf. Ser. “9th Int. Conf. on X-Ray Microscopy”. – 2009. – V. 186. – P. 012021.
  9. Chen, J. Fresnel zone-plate based x-ray microscopy in Zernike phase contrast with sub-50 nm resolution at NSRL / J. Chen, W. Li, Y. Liu, Z. Yue, J. Tian [et al] // J. Physics: Conf. Ser. “9th Int. Conf. on X-Ray Microscopy”. – 2009. – V. 186. – P. 012005.
  10. Hofsten, O. Sub-25-nm laboratory x-ray microscopy using a compound Fresnel zone plate / O. von Hofsten, M. Bertilson, J. Reinspach, A. Holmberg [et al] // Opt. Lett. – 2009. – V. 34, N 17. – P. 2631-2633.
  11. Xie, C. Feasibility study of hard-x-ray nanofocusing above 20 KeV using compound photon sieves / C. Xie, X. Zhu, H. Li, L. Shi, Y. Wang // Opt. Lett. – 2010. – V. 35, N  23. – P. 4048-4050.
  12. http://xradia.com/
  13. Kotlyar, V.V. Zone plate on a baffle for hard X-ray / V.V. Kotlyar, A.G. Nalimov, M.I. Shanina, V.A. Soifer, L. O’Faolain // Computer optics. – 2011. – V. 35, N 1.– P. 36-41. – (In Russian).
  14. Kopylov, Yu.V. Application of the parabolic wave equation to X-ray diffraction optics./ Yu.V. Kopylov, A.V. Po­pov, A.V. Vinogradov // Opt. Comm. – 1995. – Vol. 118. – P. 619-636.
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