Study of polarization sensitivity OF near-field microscope using a binary phase plate
S.N. Khonina, S.V. Alferov, S.V. Karpeev, O.Yu. Moiseev

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Full text of article: Russian language.

DOI: 10.18287/0134-2452-2013-37-3-326-331

Pages: 326-331.

Abstract:
We investigate theoretically and experimentally distribution of electric field components in a focal plane at rotation of a plate with p-phase jump placed in the focused beams. We analyze the polarizing sensitivity of the various apertured metalized probes on the basis of comparison of theoretical and experimental results. It is shown, that with growth of diameter of the aperture window of a probe an essential change of sensitivity occurs in favor of transverse components of the electric field and growth of signal transfer factor of a probe.

Key words:
sharp focusing, plate with phase jump, electric field components, near-field scanning microscope, aperture metalized probes.

References:

  1. Novotny, L. Longitudinal field modes probed by single molecules / L. Novotny, M.R. Beversluis, K.S. Young­worth, and T.G. Brown // Phys. Rev. Lett. - 2001. - V. 86, N 23. - P. 5251-5254.
  2. Xie, X.S. Probing single molecule dynamics / X.S. Xie and R.C. Dunn // Science. - 1994. - V. 265. - P. 361-364.
  3. Dorn, R. Sharper focus for a radially polarized light beam / R. Dorn, S. Quabis and G. Leuchs // Phys. Rev. Lett. - 2003. - V. 91. - P. 233901.
  4. Kitamura, K. Sub-wavelength focal spot with long depth of focus generated by radially polarized, narrow-width annular beam / K. Kitamura, K. Sakai and S. Noda // Opt. Express. - 2010. - V. 18, N 5. - P. 4518-4525.
  5. Hao, B. Experimental measurement of longitudinal component in the vicinity of focused radially polarized beam / B. Hao and J. Leger // Opt. Express. - 2007. - V. 15, N 6. - P. 3550-3556.
  6. Novotny, L. Longitudinal field modes probed by single molecules / L. Novotny, S.J. Stranick // Annu. Rev. Phys. Chem. - 2006. - V. 57. - P. 303-331.
  7. Wang, J. Development and prospect of near-field optical measurements and characterizations / J. Wang, Q. Wang, M. Zhang // Front. Optoelectron. - 2012. - V. 5, N 2. - P. 171-181.
  8. Jia, B. Direct observation of a pure focused evanescent field of a high numerical aperture objective lens by scanning near-field optical microscopy / B. Jia, X. Gan and M. Gu // Appl. Phys. Lett. - 2005. - V. 86. - P. 131110.
  9. Bouhelier, A. Surface plasmon interference excited by tightly focused laser beams / A. Bouhelier, F. Ignatovich, A. Bruyant, C. Huang, G. Colas des Francs, J.-C. Weeber, A. Dereux, G.P. Wiederrecht and L. Novotny // Opt. Lett. - 2007. - V. 32, N 17. - P. 2535-2537.
  10. Chen, W. Realization of an evanescent Bessel beam via surface plasmon interference excited by a radially polarized beam / W. Chen and Q. Zhan // Opt. Lett. - 2009. - V. 34, N 6. - P. 722-724.
  11. Kotlyar, V.V. Analysis of the shape of a subwavelength focal spot for the linearl y polarized light / V.V. Kotlyar, S.S. Stafeev, Y. Liu, L. O’Faolain and A.A. Kovalev // Appl. Opt. - 2013. - V. 52, N 3. - P. 330-339.
  12. Zayats, A.V. Apertureless near-field optical microscopy via local second-harmonic generation / A.V. Zayats, V. Sandoghdar // J. Microscopy. - 2001. - V. 202. - P. 94-99.
  13. Bouhelier, A. Nearfield scattering of longitudinal fields / A. Bouhelier, M.R. Beversluis and L. Novotny // Appl. Phys. Lett. - 2003. - V. 82(25). - P. 4596-4598.
  14. Descrovi, E. Optical properties of microfabricated fully-metal-coated nearfield probes in collection mode / E. Des­crovi, L. Vaccaro, L. Aeschimann, W. Nakagawa, U. Stau­fer and H.-P. Herzig // JOSA A. - 2005. - V. 22(7). - P. 1432-1441.
  15. Novotny, L. Nearfield imaging using metal tips illuminated by higher-order Hermite-Gaussian beams / L. Novotny, E.J. Sanchez, X.S. Xie // Ultramicroscopy. - 1998. - V. 71. - P. 21-29.
  16. Khonina, S.N. Controlling the contribution of the electric ?eld components to the focus of a high-aperture lens using binary phase structures / S.N. Khonina, S.G. Volotovsky // J. Opt. Soc. Am. A. - 2010. - V. 27(10). - P. 2188-2197.
  17. Richards, B. Electromagnetic diffraction in optical systems. II. Structure of the image ?eld in an aplanatic system / B. Richards and E. Wolf // Proc. Royal Soc. A. - 1959. - V. 253. - P. 358-379.
  18. Khonina, S.N. Influence of vortex transmission phase function on intensity distribution in the focal area of high-aperture focusing system / S.N. Khonina, N.L. Kazanskiy, S.G. Volotovsky // Optical Memory and Neural Net-works (Information Optics), Allerton Press. - 2011. - V. 20, No. 1. - P. 23-42.
  19. Khonina, S.N. Strengthening the longitudinal component of the sharply focused electric field by means of higher-order laser beams / S.N. Khonina, S.V. Alferov, S.V. Karpeev // Optics Letters. -2013. - V. 38, No. 17. - P. 3223-3226.
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