A coherent measurement method for checking the surface microrelief depth in holographic and diffractive optical elements
V.V. Kolyuchkin, E.Yu. Zlokazov, S.B. Odinokov, V.Ye. Talalaev, I.K. Tsyganov

 

Bauman Moscow State Technical University,

National Research Nuclear University MEPhI

Full text of article: Russian language.

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Abstract:
Security holograms have been widely used for document and product authenticity protection. The quality of security holograms and master-matrices signi?cantly depends on the perfection of the diffraction grating. The authors introduce a method for checking the security hologram quality based on indirect measurements of diffraction grating parameters. Theoretical results concerned with the use of this method  for microrelief quality control are discussed.

Keywords:
holography, diffraction gratings, diffraction theory, holographic optical elements, diffractive optical elements.

Citation:
Kolyuchkin VV, Zlokazov EYu, Odinokov SB, Talalaev VYe, Tsyganov IK. A coherent measurement method for checking the surface microrelief depth in holographic and diffractive optical elements. Computer Optics 2015; 39(4): 515-20. DOI: 10.18287/0134-2452-2015-39-4-515-520.

References:

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