A continuous-profile diffractive focuser for terahertz radiation fabricated by laser ablation of silicon
Tukmakov K.N., Komlenok M.S., Pavelyev V.S., Kononenko T.V., Konov V.I.

 

Samara National Research University, 34, Moskovskoye shosse, Samara, 443086, Samara, Russia,
IPSI RAS – Branch of the FSRC “Crystallography and Photonics” RAS, Molodogvardeyskaya 151, 443001, Samara, Russia,

Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow, Russia,

National Research Nuclear University „MEPhI“, Moscow, Russia

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Abstract:
A method of high-frequency laser ablation using a two-coordinate beam scanner for the fabrication of a diffractive element of terahertz range with a continuous profile has been developed and successfully applied. Results of the characterization of the fabricated microrelief of a silicon focuser of a Gaussian beam into a square region are presented.

Keywords:
diffractive optics, free-electron lasers, terahertz radiation, laser ablation.

Citation:
Tukmakov KN, Komlenok MS, Pavelyev VS, Kononenko TV, Konov VI. A continuous-profile diffractive focuser for terahertz radiation fabricated by laser ablation of silicon. Computer Optics 2018; 42(6): 941-946. DOI: 10.18287/2412-6179-2018-42-6-941-946.

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