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On the compensation of the diffraction orders overlap effect in the offner spectrometer
L.L. Doskolovich, E.A. Bezus, D.A. Bykov

 

Samara State Aerospace University,

Image Processing Systems Institute, Russian Academy of Sciences

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Full text of article: Russian language.

DOI: 10.18287/0134-2452-2014-38-4-777-781

Pages: 777-781.

Abstract:
We analyze the performance of a diffraction-grating-based Offner spectrometer. We use the paraxial approximation to derive analytical expressions for the spatial and spectral point spread function for each diffraction order. We show that a disruptive effect of the diffraction orders overlap occurs. However, it can be compensated for by means of simple image post-processing.

Key words:
spectrometers, imaging spectrometer, multispectral and hyperspectral imaging, Offner spectrometer, diffraction gratings.

Citation:
Doskolovich LL, Bezus EA, Bykov DA. On the compensation of the diffraction orders overlap effect in the offner spectrometer. Computer Optics 2014; 38(4): 777-781. DOI: 10.18287/0134-2452-2014-38-4-777-781.

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