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Evaluation of the influence of surface irregularity of optical crystal microresonators on their dispersion characteristics
A.N. Danilyn 1, A.I. Yurin 2,4, N.M. Kondratyev 1, D.D. Ruzhitskaya 1, N.Yu. Dmitriev 1, F.V. Bulygin 3, S.G. Semenchinsky 3, M.I. Krasivskaya 2, K.N. Min’kov 1

1 Russian Quantum Center,
121205, Moscow, Territory of the Skolkovo Innovation Center, Bolshoy Boulevard, 30, building 1;
2 HSE University, 101000, Moscow, Russia, Myasnitskaya 20;
3 All-Russian Scientific Research Institute of Metrological Service, 119361, Moscow, Russia, Ozernaya 46;
4 All-Russian Scientific Research Institute for Optical and Physical Measurements,
119361, Moscow, Russia, Ozernaya 46

 PDF, 1248 kB

DOI: 10.18287/2412-6179-CO-1100

Pages: 580-587.

Full text of article: Russian language.

Abstract:
Advantages and prospects of using optical microresonators for the development of measuring instruments based on frequency combs are described. A principle of a frequency comb generator based on an optical microresonator is considered. An example of modeling the properties of microresonators used to generate optical frequency combs is considered. The influence of the nonuniformity of the optical microresonator’s generatrix on the value of the total dispersion has been studied. It is shown that the presence of nonuniformity on the surface affects the dispersion parameters and can also lead to the effect of mode shape splitting in microresonators. We have shown that this effect is particularly dependent on the position and the value of the depth of nonuniformity.

Keywords:
whispering-gallery-mode microresonators, finite element method, dispersion engineering.

Citation:
Danilyn AN, Yurin AI, Kondratyev NM, Ruzhitskaya DD, Dmitriev NY, Bulygin FV, Semenchinskiy SG, Krasivskaya MI, Min’kov KN. Evaluation of the influence of surface irregularity of optical crystal microresonators on their dispersion characteristics. Computer Optics 2023; 47(4): 580-587. DOI: 10.18287/2412-6179-CO-1100.

Acknowledgements:
This work was supported by the All-Russian Research Institute for Optical and Physical Measurements Federal State Unitary Enterprise (VNIIOFI). We also acknowledge the Foundation for the Advancement of Theoretical Physics and Mathematics "BASIS" for personal support.

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