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Pages: 74-77.
Full text of article: Russian language.
Abstract:
When developing fiber-optic and optoelectronic sensor equipment for measuring displacements,
position, deformations, and other mechanical quantities, the developers always have to take into
account the peculiarities of the propagation of light flux through the optical path (OP) of the measuring
device. When passing through the OP, the radiation is transformed by changing the intensity,
phase, directivity, polarization or wavelength. The reflected, transmitted or re-emitted light flux
leaves the OP and enters the photodetector, which produces an electrical signal containing the measurement
data.
Citation:
Ratis YL, Leonovich GI. Light flux diffraction on sensitive elements of fiber-optic and
optoelectronic sensors of mechanical displacements. Computer Optics 1996; 16: 74-77.
References:
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