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Analysis of light propagation through one-level DOE-fragments with fabrication errors

D.L. Golovashkin1,2, V.S. Pavelyev1,2, M. Duparre3, V.V. Kononenko4

IPSI RAS – Branch of the FSRC "Crystallography and Photonics" RAS,
443001, Samara, Russia, Molodogvardeyskaya 151,
Samara National Research University, 443086, Samara, Russia, Moskovskoye Shosse 34,
3Institute of Applied Optics, Friedrich Schiller University (Jena, Germany)
44Natural Science Center of the General Physics Institute of RAS

 PDF, 205 kB

Pages: 62-64.

Full text of article: Russian language.

Abstract:
The work is devoted to the analysis of systematic technological errors arising during the production of diamond DOEs by laser ablation. The purpose of this article is a numerical analysis of the effect of manufacturing errors shaped as a “lip” at the interface of elementary structuring areas with the same calculated microrelief height. The article draws conclusions about the permissible height of the “lips” and the nature of influence of technological errors of various shapes on the operation of the DOE.

Keywords:
DOE, technological error, diamond DOEs, laser ablation.

Citation:
Golovashkin DL, Pavelyev VS, Duparre M, Kononenko VV. Analysis of light propagation through one-level DOE-fragments with fabrication errors. Computer Optics 2001; 22: 62-64.

References:

  1. Golovashkin DL, Duparre M, Pavelyev VS, Soifer VA. Simulating the transmission of IR radiation through a diamond diffractive lens with subwavelength microrelief technological errors [In Russian]. Computer Optics 2001; 21: 131-133.
  2. Kononenko VV, Konov VI, Pimenov SM, Prokhorov AM, Pavelyev VS, Soifer VA. Diamond diffractive optical elements for high-power CO2 lasers [In Russian]. Sov J Quantum Electron 1999; 26(1): 9-10.
  3. Petit R, ed. Electromagnetic theory on gratings. Berlin, Heidelberg: Springer-Verlag, 1980).
  4. Doskolovich LL. Diffraction by transmission dielectric gratings [In Russian]. In Book: Soifer VA, ed. Methods of computer optics [In Russian]. Moscow: "Fizmatlit" Publisher; 2000: 158-175.

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